diener electronic : SEM


	SEM Scanning Electron Microscopy, most widespread method for the highresolution imaging of solid surfaces. The surface is irradiated withelectrons, the backscattering by secondary electrons is measured,resulting in a direct depiction of the surface landscape.

	首頁 \| 電漿技術 \| 專業術語 \| 常見問題 \| 電漿系統 \| 連結/地區代理商 \| 滿意客戶 \| 下載圖片 \| 巡迴展覽 \| 保持連絡 \| 如何前往 \| 簡介

	© 2007 Diener electronic North America