Home
Plasmatechnique
Glossary of terms
FAQ
Products
Services
Links/representatives
References
Download
Trade fairs
Contact
Approach
About us
AFM
Atomic Force Microscopy, surface analytical method comprising the scanning of a surface by a tiny needle on a thin lever. Examination of the forces between needle and surface allows detailed depictions of the surface structure.
Home
|
Plasmatechnique
|
Glossary of terms
|
FAQ
|
Products
|
Services
|
Links/representatives
|
References
|
Download
|
Trade fairs
|
Contact
|
Approach
|
About us
© 2007 Diener electronic
North America
